Characterization of Material Morphology, Composition, and Porosity using SEM, XPS, and N2 Adsorption

The material was observed for its microscopic morphology and size using a scanning electron microscope (SEM, Quanta 250). X-ray photoelectron spectroscopy (XPS, AXIS-ULTRA DLD) was used to analyze the composition of the substance. By comparing the X-ray diffraction pattern of the sample with known crystalline materials, the qualitative identification of the sample's phase composition and structure can be achieved. The N2 physical adsorption and desorption test was conducted to investigate the pore structure, with the main parameters being the specific surface area and pore size. The test temperature was -196.15 ℃. The Brunauer Emmett-Teller (BET) equation was used to calculate the single-point and multipoint specific surface areas of the sample. The SF (Saito Foley) method and the empirical plotting (T-plot) method were used to analyze the pore size distribution of the material.