翻译Fig 13 Degradation of ΔVTH with the temperature variation for devices biased at different VGT and VDS with W = 20 nm and two NA 5 × 1018 cm−3 and 1 × 1019 cm−3 resultant from a stress time of 103 s
图13. ΔVTH随温度变化的降解情况,对于偏置于不同VGT和VDS下的器件,其中W = 20 nm,NA为两种(5×1018 cm−3和1×1019 cm−3),结果来自于应力时间为103秒。
原文地址: https://www.cveoy.top/t/topic/fqLI 著作权归作者所有。请勿转载和采集!