Scanning Thermal Probe for Spatially Resolved Voltage Response in YIG-bulk/Pt Samples

This research involved using a scanning thermal probe, which consisted of a micropatterned cantilever with a heated tip, to generate a localized temperature difference (ΔT) within a YIG-bulk/Pt sample. By scanning the cantilever tip across the sample, the researchers observed a spatially resolved voltage response. This voltage response was found to be directly related to the magnetic domain distribution, as confirmed by magnetic force microscopy. This approach provides a novel method for investigating the interplay between heat and magnetism in these materials.