Single Photon Avalanche Detectors for Object Recognition and Rotation Measurement

In our experiments, we employed single photon avalanche detectors as the two detectors. The conformal counts were acquired from the data recorded by the board. For the object recognition measurements shown in Figure 3, we utilized a conformal integration time of 10 seconds for each grating change. All the data were normalized relative to the maximum value. The maximum compliance counts for Figures 3a-c were 648, 908, and 855 correspondingly. Similarly, when measuring object rotation, we conducted 10-second compliance counts and normalization for each rotation angle.