采用扫描电子显微镜SEM Quanta 250对材料进行了微观形貌和尺寸的观察。X射线衍射XPS AXIS-ULTRA DLD用来分析物质构成通过样品的X射线衍射图与已知的晶态物质的X射线衍射谱图的对比分析便可以完成样品物相组成和结构的定性鉴定。利用N2物理吸脱附测试测试孔结构主要结果参数是比表面积及孔径大小测试温度为-19615 ℃。利用Brunauer Emmett-Teller BET方程计

The material was observed for its microscopic morphology and size using a scanning electron microscope (SEM, Quanta 250). X-ray photoelectron spectroscopy (XPS, AXIS-ULTRA DLD) was used to analyze the composition of the substance. By comparing the X-ray diffraction pattern of the sample with known crystalline materials, the qualitative identification of the sample's phase composition and structure can be achieved. The N2 physical adsorption and desorption test was conducted to investigate the pore structure, with the main parameters being the specific surface area and pore size. The test temperature was -196.15 ℃. The Brunauer Emmett-Teller (BET) equation was used to calculate the single-point and multipoint specific surface areas of the sample. The SF (Saito Foley) method and the empirical plotting (T-plot) method were used to analyze the pore size distribution of the material