将6Alam MAA Critical Examination of the Mechanics of Dynamic NBTI for PMOSFETsAIEEE International Electron Devices Meeting 2003C2003改成知网格式
Alam, M.A. (2003). A Critical Examination of the Mechanics of Dynamic NBTI for PMOSFETs. In Proceedings of the IEEE International Electron Devices Meeting 2003.
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