help me change this paragraph to english 此外所提出的PUF芯片具有优异的intra-die and inter-die hamming distance特性which 分别为00073 and 05014并且所生成的响应序列均通过了NIST SP800-22 test。

In addition, the proposed PUF chip exhibits excellent intra-die and inter-die Hamming distance characteristics, which are 0.0073 and 0.5014 respectively, and the generated response sequences have passed the NIST SP800-22 test.