Please change to another expression according to the standard of a scientific paper Samples were coated with ultra-thin carbon or Au to reduce charging effects prior to SEM imaging with a Helios Nanol

In order to mitigate charging artifacts, specimens were subjected to ultra-thin carbon or Au coating before imaging using a Helios Nanolab 660 Dual Beam electron microscope (FEI, OR) operating at an acceleration voltage of 5 kV and a working distance of roughly 4 mm.